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E-mail
xqjiang@rtec-instruments.cn
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Phone
18013892749
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Address
Room 305, 26 Shangdi Chuangye Middle Road, Haidian District, Beijing
Beijing Zhongjingyi Technology Co., Ltd
xqjiang@rtec-instruments.cn
18013892749
Room 305, 26 Shangdi Chuangye Middle Road, Haidian District, Beijing
White light interferometersummary:
Rtec is manufactured in Silicon Valley, California. It has been used by multiple laboratories, universities, and industries. The UP series combines four imaging modes on one head. Capable of running multiple tests on the same testing platform, simply click a button to switch imaging modes. This combination can easily image any surface such as transparent, flat, dark, flat, curved surfaces, etc. Each imaging mode has its own advantages, and the various technologies complement each other. This integration technology not only facilitates comprehensive data analysis, but also reduces maintenance costs, thereby improving efficiency.
3D optical profilometer combination
1.White light interferometer;
2. Rotating disk confocal microscope;
3. Dark field microscope;
4. Bright field microscope.
Main platform specifications:
Product Specifications
1. Standard electric platform 150x150mm (optional 210x310mm)
2. Standard turret, electric turret optional
3. The vertical range can reach 100mm
4. Tilt stage at 6 degrees
5. XY platform resolution of 0.1um
6. Automatic splicing model
Sigma Head-White light interferometer
Lambda Head-White light interferometer+Confocal+dark field+bright field
application
Roughness; Volume wear and tear; Step height; Film thickness; appearance
Test image example:



The above is the sample morphology captured by a dual-mode 3D surface profilometer. By combining multiple optical technologies on the same platform, the tester can measure almost any type of nm resolution sample. This surface profiler is equipped with powerful analysis software that meets multiple standards. The dual-mode 3D surface profilometer can run multiple tests on the same testing platform, and the combination of products can be changed according to different technical application requirements. Different modes of experimental testing can be performed on the same area of the sample, and mode switching can achieve automation. The integration of multiple technologies can enable different technologies to fully leverage their respective advantages on the same detector. This integration technology not only facilitates comprehensive data analysis, but also reduces maintenance costs, thereby improving efficiency.