Which is a good fully automatic 3D profilometer

3D profilometerOverview

Rtec 3DmorphometerMade in Silicon Valley, California. It has been used by multiple laboratories, universities, and industries. UPseriesFour imaging modes are combined on one head.Ability to run multiple tests on the same testing platform，Simply click the button to switch imaging modes. This combination can easily image any surface such as transparent, flat, dark, flat, curved surfaces, etc. Each imaging mode has its own advantages, andvariousTechnologies complement each other.This integration technology not only facilitates comprehensive data analysis, but also reduces maintenance costs, thereby improving efficiency.

3D optical profilometer combination

White light interferometer

Rotating disk confocal microscope

Dark field microscope

Bright field microscope

Main platform specifications

Product Specifications

Standard electric platform 150x150mm (optional 210x310mm)

Standard turret, electric turret optional

Vertical range up to 100mm

Tilt stage 6 degrees

XYplatformResolution of 0.1um

Automatic splicing model

Sigma Head White Light Interferometer

Lambda Head - White Light Interferometer+Confocal+Dark Field+Bright Field

application

●roughness●Volume wear●Step height●Film thickness●appearance

Test image example

DLC coating ball rough coating surface spherical wear spot

Diamond biofilm microfluidic channel

Polymer coated ink mark coin

The failure marks and scratches of the grinding pad aluminum

Coating failure trace, chip channel, wafer

The above isDual mode 3D surfaceprofilometerThe morphology of the photographed sample. By combining multiple optical technologies on the same platform, the tester can measure almost any type of nm resolution sample. This surfacecontourThe instrument is equipped with powerful analysis software that meets multiple standards. Dual mode 3D surfacecontourThe instrument can run multiple tests on the same testing platform, and the combination of products can be changed according to different technical application requirements. Different modes of experimental testing can be performed on the same area of the sample, and mode switching can achieve automation. The integration of multiple technologies can enable different technologies to fully leverage their respective advantages on the same detector. This integration technology not only facilitates comprehensive data analysis, but also reduces maintenance costs, thereby improving efficiency.