YP-150I macro observation lighting device for detecting various defects

NegotiableUpdate on 01/18

Model

Nature of the Manufacturer: Producers

Product Category

Place of Origin

Online Consult

Overview

High brightness halogen light source device is a macroscopic observation lighting device used to detect various defects such as foreign objects, scratches, uneven grinding, haze, and slip on the final processing surface of semiconductor chips and liquid crystal substrates, which is the most labor-intensive during processing.

Product Details

High brightness halogen light source device is most commonly used in the processing of semiconductor chips and liquid crystal substrates

Foreign objects, scratches, uneven grinding, haze, slippage, etc. on the final processed surface that require manpower

A macroscopic observation lighting device used for detecting various defects.

Summary

1 . Illumination of 400000 LX or more can be applied to the surface of the sample.

2 . The light source uses halogen lamps, resulting in high color temperature and uneven lighting

Becoming a very stable and sharp illumination.

3 . After using cold mirrors, the thermal impact reached one-third of that of traditional aluminum mirrors

less and less.

4 . By using a two-level switching mechanism, one click switching between high light observation and low light observation

The hyperbolic tangent value.

YP-150I illumination range with a diameter of 30

YP-250I illumination range with a diameter of 60

YP-250I can choose between propeller fan type and ducted fan type. ）