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E-mail
1415268707@qq.com
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13764885152
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Room 4597, Building 6, No. 1150 Lanfeng Road, Fengxian District, Shanghai
Shanghai Jintong Instrument Co., Ltd
1415268707@qq.com
13764885152
Room 4597, Building 6, No. 1150 Lanfeng Road, Fengxian District, Shanghai
Olympus Optical Measurement MicroscopeIntroduction
Highly trusted STM7 measuring microscope——
Based on the century long Olympus technology
The STM7 measuring microscope series adopts the technology of Olympus throughout history and draws on over a century of experience in microscope research and development and more than 50 years of experience in measuring microscope research and development, ensuring reliable quality.
The optical technology enables realistic imaging of extremely fine samples.
Advanced measurement technology enables accurate measurement of samples.
The automatic focusing and focusing navigation system make measurements simpler and more accurate.
A comprehensive traceability system can provide reliable and trustworthy measurements.
Therefore, over the years,Olympus Optical Measurement MicroscopeAlways favored by users.
STM7By integrating optical microscopes and advanced measurement capabilities, precise measurements can be achieved
Years of experience in microscope development have achieved excellent observation performance
Olympus Measurement Microscope STM7The series adopts the UIS2 infinity correction optical system currently used in optical microscopes. Therefore, the observed images have high resolution and contrast, and aberrations are also eliminated to ensure high-precision measurement of small details.
Bright field image and dark field image
Differential interference image polarized image
The finely carved granite platform base enhances the reliability of measurements
To further ensure measurement accuracy, the STM7 series adopts a highly durable and vibration resistant mirror frame equipped with a granite base. Due to the high stability of granite, measurements can reach sub micron levels while ensuring a significant reduction in errors.
STM7-LF FEM analysis
As a pioneer in height measurement, we continue to provide simple and easy to operate high-precision solutions3Axis measurement
With the increasing miniaturization and precision of modern manufacturing technology, high-precision measurement is becoming increasingly important - not only in the XY plane, but also in the Z-axis direction. Olympus has successfully developedMeasuring microscopeThe company has responded to this increasing demand by using an automatic focusing system that utilizes active reflection and confocal methods.
Active reflection, confocal autofocus system optical path
Strict traceability system ensures reliable quality
Olympus controls the accuracy of measuring microscopes through a strict traceability system. And Olympus also provides traceable calibration services during system installation.
Measurement microscope traceability system
STM7The lineup
Each model is equipped with a 3-axis measurement system with a reading of 0.1 μ m
Manual Z-axis focusing model
STM7-SF
Equipped with a 50mm x 50mm stage or a 100mm x 100mm stage
STM7-MF
Equipped with a 200mm x 200mm loading platform
STM7-LF
Equipped with a 300mm x 300mm loading platform
Electric Z-axis focusing model
STM7-SFA
Equipped with a 50mm x 50mm stage or a 100mm x 100mm stage
STM7-MFA
Equipped with a 200mm x 200mm loading platform
STM7-LFA
Equipped with a 300mm x 300mm loading platform
STM7We attach great importance to usability in our design
Provide a stage suitable for your sample size
Frequently Asked Questions
·Short measurement travel cannot meet the measurement needs of larger samples.
·So far, the large stage has provided sufficient measurement travel in the X-axis direction, but the Y-axis travel is still relatively small. During the measurement process, it is necessary to compensate for the Y-axis stroke that is shorter than the X-axis coverage by rotating the sample, which is time-consuming and inefficient.
·Due to the narrow measurable range, it is not possible to arrange a large number of samples instageTo achieve simultaneous measurement at once.
STM7Solution
·There are four types of square measuring platforms available for measuring stroke (50 mm x 50 mm, 100 mm x 100) mm,200 mm x 200 mm, And 300 mm x 300 mm). Whether it's a large sample or a small sample, there is always a stage that will be suitable for the sample you want to measure.
·The use of a clutch system allows for quick switching between coarse and fine tuning. With this switching function, the stage can also quickly move along the X-axis and Y-axis directions, and can freely shuttle on the XY plane.
·A 300mm long square stage can provide the same measurement stroke in both the X-axis and Y-axis directions, which means that all measurements of large samples, such as 300mm wafers and printed circuit boards, can be achieved without rotating the sample.
STM7-CS50(50mm x 50mm) STM7-CS100(100mm x 100mm)
STM7-CS200(200 mm x 200 mm) STM7-CS300(300 mm x 300 mm)
Observe at low and high magnification using the same microscope
Frequently Asked Questions
·Most traditional measuring microscopes can only measure objective lenses or metallographyobjective lensUnable to meet multiple observation requirements simultaneously.
STM7Solution
·STM7 can use a measuring objective by installing a measuring objective adapter, and after replacing it with an objective turntable, metallographic objectives can be used. This means that STM7 combines both metallographic optical system and measurement optical system in one measuring microscope. Through this method, whether measuring large or fine samples, or samples with large surface height differences, the STM7 series can correspond to and assist users in selecting observation methods.
Measuring objective lens
Due to the very long working distance of the measuring objective, there is no need to worry about contact between the objective and the sample when focusing on samples with large surface undulations. In addition, with the low magnification capability of the measuring objective, a larger field of view can be observed at once.
Can obtain andoptical microscopeComparable high magnification and high-resolution observation capabilities. More importantly, in addition to bright field observation, it can also correspond to dark field, polarization, and differential interference observation.
Metallographic objective lens
Bright field image and dark field image
There are two types of mirror frames to choose from: manual focusing and electric focusing
STM7The series includes two series: manual focusing and electric focusing
Focus control provides two options: manual and electric. Please choose the model that meets your needs based on the sample and measurement content, without considering the size of the stage. All mirror frames are equipped with Z-axis linear rulers, and various models of STM7 can correspond to 3-axis measurements.
Manual Z-axis focusing model
The cost-effectiveness provided by manual Z-axis focusing models - by operating the widely used focusing knob, the Z-axis can be quickly moved up and down. Provides convenience for users measuring samples with various heights.
Electric Z-axis focusing model
The use of electric focusing devices can significantly improve operability and reduce operational fatigue during focusing and height measurement. The coaxial knob design for coarse and fine focusing allows users to operate in a familiar manual like manner, while the electric motor type can also be equipped with an automatic focusing unit.
A breakthrough design control unit significantly improves the operability of measurement microscopes
Frequently Asked Questions
·Additional operating units are required for other functions. The operator is unable to quickly locate the corresponding operating unit, resulting in a significant decrease in measurement efficiency.
·Numerous operating devices, power boxes, and control boxes are scattered around the host, occupying valuable workspace.
STM7Solution
Operating device
For the Olympus STM7 series measuring microscope, almost all measuring microscope operations can be performed using a single operating device, including resetting counters, lighting control, focusing, and autofocus functions. For improved efficiency and convenience, you can place the device anywhere you want and easily operate it with one hand.
control box
The power supply and communication of each unit are integrated into a single control box. Even adding optional features such as focused navigation does not require an additional power supply, and this design can greatly reduce the occupation of workspace.
Used for manual Z-axis focusing models: STM7-HS manual operation device
Used for electric Z-axis focusing models: STM7-MCZ electric operating device
A light source manager that greatly improves observation and measurement efficiency
Frequently Asked Questions
·The traditional measurement microscope's analog knob adjustment method cannot achieve quantitative control of light intensity. In this way, the light intensity during each measurement cannot remain consistent, resulting in changes in the measured values.
·When using traditional measuring microscopes, it is necessary to adjust the light intensity every time the objective is switched, which makes the workflow very inefficient.
STM7Solution
Digital display that can quantitatively grasp the brightness of light sources
The light intensity of STM7 can be quantitatively displayed, which ensures that observation and measurement are always carried out under the same conditions.
When switching the objective lens, there is no need to manually adjust the light intensity
The light intensity manager can be used in conjunction with the encoding objective turntable configuration. The coded objective dial will automatically recognize the currently used objective lens, and combined with the preset value function of the light source manager, it can register the lighting mode and intensity for each objective lens. In this way, every time the objective lens is switched, the light intensity and illumination mode can be automatically adjusted. The manual adjustment of light intensity after switching magnification can now be omitted, just like before.
5xObjective light intensity 50 20x Objective light intensity 70 100x Objective light intensity 120
A detachable counter that can be placed in any convenient location to ensure quick inspection of measurement results and equipment status at any time.
Frequently Asked Questions
·When it is necessary to check the operation status of equipment such as lighting status and measurement results, the display on different units makes the operation very cumbersome.
STM7Solution
A counter that can clearly confirm the current status at a glance
The counter is equipped with indicator lights that display the device status and settings, making it easy to confirm the current set status of the device. X. The small units of the Y and Z axes can be switched between 0.1 μ m and 1 μ m, and display units can also be switched between millimeters, micrometers, inches, and mils.
The counter is installed on the mirror frame
Detachable counter that can meet personalized needs and be freely placed
Whether installed on the mirror frame or placed on the workbench, the detachable counter can be placed in the preferred location according to the user's usage condition and habits. When the user is standing for measurement, the counter can be installed on one side of the mirror frame at approximately the same height as the observation position for easy observation and inspection of the results. When users observe and measure on the monitor through a digital camera, or use an electric Z-axis focusing model, they can easily sit on a chair and work by placing the counter and operating device on the workbench.
The counter is placed on the workbench
The repeatability of the autofocus system
Realize faster, simpler, and more accurate height measurement
Frequently Asked Questions
·When conducting visual measurements, different operators will obtain different height measurement values. In addition, this measurement method is very time-consuming and inefficient.
STM7Solution
A focusing system with superior repeatability, simplicity, and high precision
By projecting the pattern within the field of view and having the operator confirm the overlap of the upper and lower patterns, Olympus' focused navigation system achieves highly repetitive height measurement operations. When conducting height measurements through ordinary visual observation, even images that appear very clear and in focus may have slight errors. By using the STM7 focused navigation system, measurements can be made simply by matching the markers, thus reducing the subjective impact of the operator on the measurement results.
Visual height measurement
Focus on navigation system
Below the focal point, above the focal point
The advantages of automatic focusing enable fast and high-precision height measurement
Frequently Asked Questions
·When conducting visual measurements, the height measurement results obtained by different operators may also vary.
·Manual height measurement requires the operator to repeatedly move the stage and use a knob to focus, which makes the measurement both time-consuming and inefficient.
·It is difficult to focus on small objects, such as wires.
STM7Solution
Auto focus unit: excellent reproducibility and focusing speed
Regardless of the operator's experience, the STM7 autofocus unit can achieve highly accurate height measurement in a short period of time. Even rough or tilted sample surfaces can be stably focused using active reflection and confocal methods, while small-diameter lasers can ensure automatic focusing on small objects such as leads.
Single focus mode
After performing autofocus, it can instantly transition from a rough focus state to a clear focus at the center of the field of view.
Tracking mode
After enabling the distinctive tracking mode, it will automatically focus according to the ups and downs of the sample surface, even when moving the worktable, it can always maintain a focused state. This allows the operator to observe without leaving the X and Y handles, greatly improving the measurement efficiency of the Z-axis.
Accessories for expanding observation and measurement range
Coded objective disc
Pairing the coding objective dial with a digital camera can display the magnification of the objective lens on the screen during observation, making it easier for you to record the magnification. At the same time, when switching the magnification, it can also adjust the settings in conjunction with the calibration values and light intensity recorded in the software. There are two options for you to choose from: bright field objective and dark field objective
MM6-EMO/Positive Monocular Tube
A monocular tube is used for upright images. Can be used in conjunction with MM6-OCC10 x (eyepiece with crosshairs).
Implemented data transmission without the need for hands, allowing operators to complete measurements without leaving the X and Y handles.
It has the characteristics of small size, lightweight, long service life, and low power consumption. In addition, this cost-effective LED lighting unit will not flicker or fluctuate in brightness.
SZX2-ILR66+SZX-RHS/LED circular lighting device+manual control unit
The SZX-RHS manual control unit can achieve four independent lighting segments of the SZX2-ILR66 reflective LED ring lighting device and provide clear images with high color temperature. Lighting that can be selected from 13 modes.
Using the fine-tuning knob can easily achieve parallel alignment of the sample.
STM7-RS100 with STM7-CS100 100mm x 100mm stage
STM7-R200 is used for STM7-C2200 200mm × 200mm stage
STM7-RS300 is used for STM7-CS300 300 mm × 300mm stage
A system designed specifically for more advanced measurements
Measurement Support System
For displaying the data and images output by a measuring microscope, the clearer the view, the more convenient and efficient it is to use and measure. The development of the all-new Olympus is driving the realization of complex measurements with higher precisionmeasurement softwareThe reason lies in. This software can also be used in conjunction with digital cameras.
After placing the sample, measurement can begin - there is no need to align the sample in parallel
direct measurement
Accept coordinate information output by STM7 for measurement.
Call measurement again
The coordinates obtained after measurement or calculation can also be used for subsequent measurements. This avoids duplicating the same work, thereby achieving a smoother and more efficient workflow.
Virtual point measurement
By drawing straight lines and circles, intersection points, midpoints, lengths, and a series of other measurement items can be formed, which can then be retained as reference points on the collected sample images.
Alignment measurement
The origin and X-axis can be set according to the sample, so that measurements can be taken even when the sample is not aligned parallel to the stage.
Original axis, new axis
XZplane surveying
Traditional measuring microscopes mainly focus on measuring the XY plane when viewed from above. In response to users' demand for measuring cross-sectional direction from a side view perspective, Olympus has built-in the XZ plane measurement function in the STM7-BSW. Measurements that were previously difficult to implement have now become much easier - such as measuring the radius of a hemispherical object's vertical cross-section, or measuring the depth of a groove with a curved bottom compared to a reference line.
Measurement of the height between the bottom of the groove and the reference line for measuring the radius of a hemispherical sample
Record the steps for repeated measurements
Macro registration
Frequently used alignment and other measurement steps can be combined and defined as a single macro button, so that there is no need to start from scratch after each microscope startup.
Repeat measurement execution
By simply moving the stage and obtaining coordinate values according to the instructions in the recorded teaching list, it is easy to perform repeated measurements and complete all assignments. This function can be used to repeatedly perform the same measurement items on samples of the same type. In addition, if set values and tolerances are set in the recorded teaching list, the software can automatically determine when the measured value exceeds the specification.
NG result example
Navigation of measurement points for repeated measurements
This function can display the direction and distance of moving to the next measurement point, thereby eliminating the operator's distress in this process. This function also eliminates the trouble of confirming the next measurement point on the drawing before each movement, and improves the speed of the operator's operation when repeating measurements.
Convenient function that can eliminate the subjective influence during the measurement process
Automatic edge detection
This function detects the edges of the sample, automatically obtains the coordinates of the sample, and measures them. Therefore, the operator no longer needs coordinates, reducing the subjective impact of the operator on the measurement. Another feature of automatic edge detection is its timed function, which automatically obtains coordinates after a specified time. The timing function and foot switch function enable the operator to concentrate on measuring without leaving the handle of the loading platform.
Multi point automatic edge detection within a circle
Outlier elimination
During the edge detection process, abnormal points such as metal burrs can be automatically excluded. In this way, regardless of the state of the sample, consistent measurement and calculation results will be obtained. In addition, the excluded outliers can also be displayed on the screen in different colors.
Abnormal point elimination function for samples with abnormal points
lighting control
The intensity of microscope illumination can also be precisely controlled through software. When registering a teaching list for repeated measurements, the setting of light intensity can also be saved, so that measurements can be carried out under the same lighting conditions during repeated measurements or automatic edge detection processes.
Automatic magnification recognition (optional, only applicable to the configuration of encoding objective disc)
By using the coded objective dial, the previously set calibration values can be automatically recalled when switching objectives. This can always display the appropriate scale on the monitor.
Generate customized reports
One click report generation
The measurement results can be output in Excel format with just one click, which avoids the possibility of errors during data recording. Images can also be pasted together with measurement results, thereby achieving more efficient report generation.
Optional feature: Multi Image Splicing (MIA) function
Splicing multiple images can obtain a wide area image with high magnification. Because images are pieced together based on coordinate data, the system is able to generate highly reliable images.
Optional feature: Depth of Field Expansion (EFI) function
For samples with uneven and complex surface shapes, the EFI function can effectively capture images with good focus throughout the entire height range. When using EFI function, move the Z-axis to obtain multiple images with different focal positions, then perform image processing and merge them into one fully focused image. If an electric Z-axis module is used, one click automatic image synthesis can be achieved.