Power device analyzer supplier

For new energy vehicles, gasoline engines, fuel tanks, or transmissions are no longer used, and the "three electric systems" - batteries, motors, and electronic control systems - have been replaced with new components such as DC-DC modules, motor control systems, battery management systems, and high-voltage circuits. And power semiconductorsPower Device Analyzer B1506AIt is the core of electrical energy conversion and circuit control in electronic devices, playing a role in power conversion, power amplification, power switching, line protection, and rectification in electronic circuits.

challenge

Power semiconductors have the advantages of high input impedance and low conduction voltage drop; At the same time, its chip belongs to the automotive grade power electronics chip, which needs to operate in high current, high voltage, and high frequency environments, and has high reliability requirements for the chip. This has brought certain difficulties to its testing:

Specifically reflected in the following aspects:

Power semiconductors are multi port devices that require collaborative testing with multiple instruments;

The smaller the leakage current of power semiconductors, the better, and high-precision equipment is required for testing;

The current output capability of power semiconductors is very strong, and during testing, it is necessary to quickly inject 1000A current and complete the sampling of voltage drop;

Vehicle grade power semiconductors require high voltage resistance, generally ranging from several thousand to ten thousand volts, and require measuring instruments with high voltage output and NA leakage current testing capabilities under high voltage;

Due to the high current operation of automotive grade power semiconductors, the self heating effect is significant, and in severe cases, it can easily cause device burnout. It is necessary to provide a μ s level current pulse signal to reduce the self heating effect of the device;

The input-output capacitance has a significant impact on the switching performance of the device, and the equivalent junction capacitance of the device varies at different voltages. Therefore, C-V testing is necessary.

The response of Dede Technology

Corresponding to static testing, Shide Technology has adopted traditional testing methods recognized by the industry to combine I-V and C-V together and achieve automated testing.

● Wiring method for high current testing - Remote Sense four wire method

The 2-wire method is suitable for testing with high resistance and low current; When the measured resistance is very small and the test current is large, the 4-wire connection method should be used for testing. In high gain device testing, even slight voltage changes at the gate terminal can cause drastic changes in the conduction current. It is recommended to make a 4-wire connection at the Gate end to obtain the correct and stable control voltage.

● Self heating effect - pulse measurement

IGBT and other high-power devices are prone to generate a large amount of heat due to their power characteristics. Traditional DC testing can cause rapid temperature rise, and in severe cases, it can damage the device and do not meet its operating characteristics, requiring pulse testing. Fast pulse testing (microsecond to millisecond level) reduces the stress time of power devices under voltage/current bias.

● High voltage capacitance testing - BiasT, Protection Module, CV testing

When capacitance testing encounters higher DC voltage requirements, biasT can be used to introduce this high-voltage DC signal into CV testing.

Key points on the blackboard:

Power Device Analyzer B1506ATesting of power semiconductors in areas such as research and development, production, and failure analysis.

The B1506A power device analyzer provides a complete circuit design solution to assist enterprises, universities, and research and development units in the development of power semiconductor products, achieving efficient and safe testing and verification of power semiconductors. Provide testing services for multiple scenarios including research and development, production, and failure analysis.

● Can be used for high-power testing at 3000V/1500A;

High degree of automation, generating test reports for users to analyze and process data;

Strong testing capabilities, covering parameters such as C/V, I/V, Qg, CV, Rg, Ron, Ciss, etc.

The data table feature mode provides fast and accurate measurement of all IV parameters (Vth, Vsat, Ron, breakdown, leakage, output/transmission curves, etc.); Measure the capacitance of all three terminal devices (Ciss, Coss, Crss, CIS, Coes, CRS, Rg) without changing any cable connections.

• Gate charge (Qg) measurement and power loss calculation;

Wide voltage and current output range (3 kV/1500 A);

• Thermal testing capability (-50 ° C to+250 ° C).